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A comprehensive S.M.A.R.T Diagnostics and Stress Testing Module

COMPREHENSIVE DIAGNOSTICS

DiagnoseIT is comprehensive diagnostics platform for Enterprise Storage.


S.M.A.R.T Status and Predictive Failure Analysis

S.M.A.R.T Self Tests (Short, Extended, Conveyance, Selective)

Custom Parameters/Thresholds

Random/Sequential Stress Tests

TAMPER PROOF REPORTS

DiagnoseIT generates cloud-based, digitally-signed, tamper-proof reports of the diagnostics process.


Cloud-based Reporting.

Digitally Signed.

Tamper Proof.

Access anywhere, anytime.

Diagnostics

Supported Diagnostics and Test Schedules.

Diagnostic Test Description
Health (%) Health check analyzes the overall Health value over the device which is calculated by checking S.M.A.R.T values.
Grown Defects Grown Defects check calculates the total number of Reallocated Sectors/Grown Defects on the device.
Uncorrectable Errors Uncorrectable Errors check calculates the total number of Uncorrectable Errors on the device.
SSD Percentage Used Errors SSD Percentage Used check calculates the current Wear Level of the SSD NAND Flash chips.
Estimated Remaining Lifetime Estimated Remaining Lifetime check validates the Powered-on-Hours of the device against average lifetime.
S.M.A.R.T Status S.M.A.R.T Status check evaluates the S.M.A.R.T predictive failure mechanism of the device.
S.M.A.R.T Self Test S.M.A.R.T Self Test check performs a firmware-based S.M.A.R.T Short Self Test on the device.
S.M.A.R.T Long Self Test S.M.A.R.T Self Test check performs a firmware-based S.M.A.R.T Extended Self Test on the device.
S.M.A.R.T Conveyance Self Test S.M.A.R.T Self Test check performs a firmware-based S.M.A.R.T Conveyance Self Test on the device.
Sequential Read Stress Test Performs a Sequential Read Stress Test for the given duration within the configuration.
Sequential Write Stress Test Performs a Sequential Write Stress Test for the given duration within the configuration.
Random Read Stress Test Performs a Random Read Stress Test for the given duration within the configuration.
Random Write Stress Test Performs a Random Write Stress Test for the given duration within the configuration.

Specifications

Recommended Specifications

Component Recommended Configuration Minimum Configuration (< 50 Drives) Maximum Configuration (> 50 Drives)
Server Any x86 or x64 machine Any x86 or x64 machine Any x86 or x64 machine
Processor 10 cores / 20 threads 4 cores / 4 threads 20 cores / 40 threads
Memory 64 - 128GB RAM 8 - 16GB RAM 64 - 128GB RAM
Host Bus Adapter(s) 1 x HBA per 24 x devices 1 x HBA per 24 x devices 1 x HBA per 24 x devices
Network Access Ethernet or WiFi Ethernet or WiFi Ethernet or WiFi
USB Port(s) 1 x USB 3.0 / USB-C port 1 x USB 3.0 / USB-C port 1 x USB 3.0 / USB-C port

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